Nanomaterial X-ray diffraction

X-ray diffraction is a good method for structural characterization. For a crystalline material, peaks will be sharp in a X-ray scattering spectrum. For nanomaterials, we obtain broadened peaks. So this broadening characteristic can be used for precise evaluation of particle/grain size of the material. Rigaku and Philips X-ray diffractometrs are worth buying. Freedom to select step size and scan speed is the key thing in a diffractometer. If supporting software is there then it is a bonus. Crystal structure refinement software now available which can be employed for speed refinement. For nanomaterials in the size range of 5 nm to 50 nm, X-ray diffraction is advisable even for a little bit of surface studies. Debye-Scherrer formula can be used for particle size valuation by noting down full width at half maximum.